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Explores the fundamentals and applications of High-Resolution Transmission Electron Microscopy, focusing on image formation, contrast transfer function, and optical system corrections.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
