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Covers the 2x2 transfer matrix for optical systems and the characterization using height and angle parameters, along with lens systems and entrance pupils.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
