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Related lectures (32)

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3D EDX: Challenges and Applications

Explores the challenges and applications of 3D EDX, including limitations, resolution, and quantification enhancement techniques.

Detectors: Dispersive Photon & Electron Energy

Explores dispersive photon detectors and electron energy detectors, concluding with a summary and remarks on the course.

Chemical Analysis: X-Ray Micro-Analysis XRMA

Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.

Beamlines: Primary Optics

Explores primary optics in beamlines for synchrotrons and x-ray lasers.

STEM and EDX

Covers STEM and EDX principles, X-ray generation, quantification methods, and analytical TEM applications.

Electron Microscopy: EDS

Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.

Energy Dispersive X-ray Spectroscopy

Covers the principles and applications of Energy Dispersive X-ray Spectroscopy (EDX) in elemental analysis and quantification methods in SEM.

Stress-based Frequency Tuning

Explores stress-based frequency tuning in micro/nanomechanical devices, covering black body radiation, optical nonlinearity, NETD, and dynamic range.

X-ray Fluorescence Spectroscopies

Explores synchrotrons, x-ray spectroscopies, detectors, scanning techniques, and XRF analysis of art pigments.

Physics-guided NMF for STEM/EDXS Data Analysis

Explores Physics-guided NMF for STEM/EDXS data analysis, covering challenges, optimization, constraints, and advantages of the modelization.