Advances in X-ray Energy Dispersive Spectroscopy

This lecture by the instructor covers the advances in X-ray Energy Dispersive Spectroscopy (XEDS) in the modern analytical electron microscope. It discusses the challenges of achieving multi-modal and analytical sensitivity at the sub-nanometer to near-atomic level in hard and soft matter. The lecture emphasizes the importance of not discarding any signal and improving detection limits. It delves into topics such as spectroscopic detectability limits, characteristic X-ray emission, and the influence of detector geometries on collection efficiency. The lecture also explores the practical aspects of XEDS, including specimen/detector geometry, solid angle calculations, and the impact of specimen holders on data quality.