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Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.
Explores magnetism, magnetic sources, fields, domains, hysteresis, energy contributions, types of magnetism, and nanoscale magnetic structure investigation.
