Lecture

Scanning Probe Microscopy: Advanced Modes

In course

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Description

This lecture covers the advanced modes of Atomic Force Microscopy (AFM), including contact and non-contact modes, high-speed AFM, and Magnetic Force Microscopy (MEM). It explains the differences between normal and friction force imaging, the optimization of cantilever imaging bandwidth, and the principles of Magnetic Force Microscopy. Additionally, it introduces the Scanning Near-field Optical Microscope (SNOM) and its capabilities in surpassing the diffraction limit of light microscopy. The lecture also presents the Akiyama-Probe and provides an extensive list of Scanning Probe Microscopy (SPM) techniques.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_280pptou

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