Lecture

Microfabrication Techniques: Inspection and Metrology

Description

This lecture covers microfabrication techniques for inspection and metrology, including bi-morph thermal actuator fabrication, FIB basic principles, focused ion beam imaging, local cross-sectional inspection, and Z-dimension measurement. The instructor explains the processes involved in these techniques and their applications in Micro and Nanofabrication (MEMS).

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.