Lecture
This lecture covers the principles of Stimulated Emission Depletion (STED) microscopy, focusing on the resolution enhancement achieved by overlapping excitation and depletion laser beams. It explains the factors influencing resolution, such as STED laser intensity and fluorophore saturation intensity. The use of phase masks, like Vortex phase plates, to create doughnut-shaped depletion beams is discussed. The lecture also explores the dynamic tuning of spatial resolution in STED microscopy, showcasing sub-diffraction imaging capabilities and the comparison with confocal microscopy through practical examples.