Focused Ion Beam: Principles and Applications

This lecture covers the principles and applications of Focused Ion Beam (FIB) technology, including how it works, basic applications like imaging and milling, TEM sample preparation, FIB Nanotomography, and 3D microscopy. It also discusses the advantages of using ions over electrons, ion-solid interactions, different operating modes of FIB, and gas-assisted deposition. The lecture delves into topics such as nanofabricated structures, TEM lamellae preparation, and the challenges of serial sectioning for 3D reconstruction. Additionally, it explores the spatial resolution of FIB/SEM volume reconstruction, particle recognition, and the use of FIB in biocompatible materials and nanotomography.