FIB Applications: Nanofabrication and Failure Analysis

This lecture covers the applications of Focused Ion Beam (FIB) technology in nanofabrication and failure analysis, including topics such as milling, sputtering yield, gas-assisted deposition, and TEM sample preparation. It also explores the use of FIB for manufacturing AFM tips, cross-sectioning samples, and creating nanofabricated structures. The instructor discusses the challenges and techniques involved in FIB-based TEM specimen preparation, emphasizing the importance of artifact prevention and precise lamella positioning for 3D microscopy.