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Lecture
Are you an EPFL student looking for a semester project?
Work with us on data science and visualisation projects, and deploy your project as an app on top of Graph Search.
This lecture covers the applications of Focused Ion Beam (FIB) technology in nanofabrication and failure analysis, including topics such as milling, sputtering yield, gas-assisted deposition, and TEM sample preparation. It also explores the use of FIB for manufacturing AFM tips, cross-sectioning samples, and creating nanofabricated structures. The instructor discusses the challenges and techniques involved in FIB-based TEM specimen preparation, emphasizing the importance of artifact prevention and precise lamella positioning for 3D microscopy.
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