Surface Analysis and SIMS

In course

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Description

This lecture covers the importance of surface analysis, methods of surface analysis using electrons, ions, atoms, and photons, as well as various techniques like XPS, AES, and ToF-SIMS. It also delves into the principles of photoelectron spectroscopy, depth profiling, and the advantages of ToF-SIMS for surface analysis in different fields such as optics, biocompatibility, and forensics.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_7yv1hyqa

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Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

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