Lecture

Surface Analysis and SIMS

Description

This lecture covers the importance of surface analysis, methods of surface analysis using electrons, ions, atoms, and photons, as well as various techniques like XPS, AES, and ToF-SIMS. It also delves into the principles of photoelectron spectroscopy, depth profiling, and the advantages of ToF-SIMS for surface analysis in different fields such as optics, biocompatibility, and forensics.

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