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Lecture
Surface Analysis and SIMS
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Related lectures (32)
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Analytical Electron Microscopy: Spectroscopy and Microanalysis
Explores Analytical Electron Microscopy techniques for chemical analysis using EELS and EDX.
Spectroscopy: Electronic Properties and Techniques
Explores energy spectroscopy techniques like XPS and UPS, Auger spectroscopy, surface sensitivity, and graphene band structure.
Inelastic Scattering in Transmission Electron Microscopy
Introduces inelastic scattering in transmission electron microscopy, focusing on electron energy-loss spectroscopy principles and applications.
Film Thickness Determination: XPS Analysis
Explains film thickness determination using XPS and AES techniques, covering principles, instrumentation, and analytical comparisons.
Surface Characterization: X-ray Photoelectron Spectroscopy
Covers the principles and applications of X-ray Photoelectron Spectroscopy for surface characterization.
X-rays: From Discovery to Applications
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
XPS: Surface Analysis Techniques
Introduces X-ray Photoelectron Spectroscopy (XPS) for surface analysis, covering principles, applications, analysis process, and depth profiling techniques.
Optical Methods in Chemistry: Microscopy, Manipulation, Spectroscopy
Explores optical methods in chemistry, covering microscopy, manipulation, and spectroscopy techniques.
Spectroscopy Fundamentals
Covers the fundamentals of spectroscopy, including rotational and vibrational transitions.
X-ray Photoelectron Spectroscopy: Fundamentals and Applications
Explores X-ray Photoelectron Spectroscopy fundamentals, applications, challenges, and sputtering techniques for surface analysis.
