Design for Testability: Techniques and Hardware

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Related lectures (31)

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Test of VLSI Systems: Combinational and Sequential ATPG

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Debugging

Covers testing, TDD, coverage, debugging, naming conventions, comments, and solutions for coding issues.

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Sequential Logic Circuits in VHDL

Covers modeling sequential logic circuits in VHDL, including processes, control instructions, flip-flops, counters, and registers.

Equipment Key Users Module Presentation

Covers the presentation of the equipment key users module and its focus on planning, data loading, and integration tests.

Digital Circuits: Logic Basics

Introduces digital circuits, covering binary systems, logic operators, Boolean algebra, memory elements, and practical examples like BCD decoders and shift registers.

Software Development: Debugging, Testing, and Code Management

Explores program development, debugging, testing, and code management best practices for reliable software.

Property-Based Testing: Advanced Techniques

Explores advanced software testing techniques, including property-based testing, to ensure code correctness and improve software quality.

Property-Based Testing: Advanced Techniques and Applications

Explores advanced software testing techniques, including property-based testing and various forms of fuzzing, to effectively test complex systems.

Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.