Lecture
This lecture introduces the analysis and implementation of test techniques for digital VLSI systems, covering topics such as test economics, automatic test equipment, and design for testability. Students will learn about fault modeling, fault simulation, and measures of testability, as well as the necessity of VLSI testing and popular IC testing algorithms. The course also includes hands-on computer laboratory sessions and an overview of test EDA software tools. Various defects in integrated circuits are discussed, along with the importance of verification and testing in the IC fabrication process. The lecture emphasizes the economic impact of testing and the challenges posed by the complexity and scale of modern ICs.