Logic Gates and Hazard Elimination

This lecture covers the implementation of logic gates in semiconductor materials, focusing on TTL and CMOS logic families. It discusses integrated circuits, static and dynamic hazards, gated clocks, real D flip-flops, metastability, critical paths, and switch debouncing. The presentation also delves into static-1 and static-0 hazards, their elimination using Karnaugh maps, and the concept of metastability. Additionally, it explores the theory of zero-delay models in complex logic circuits, addressing dynamic hazards and the behavior of D flip-flops. The lecture concludes with insights into ALUs, counters, shift registers, ring counters, Johnson counters, and linear feedback shift registers.