Microscopy Objectives: Correction and Aberrations

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Explores High Resolution Transmission Electron Microscopy principles, including contrast transfer, image formation, and Cs correctors.

Crystal Structure Imaging

Explores high-resolution transmission electron microscopy for crystal structure imaging, covering aberrations, defocus values, CS correctors, and advanced techniques.

Electron Beam Lithography: Tool Overview

Explores electron beam lithography, covering electron gun brightness, lens aberrations, beam diameter, and tool implementation.

Image Acquisition

Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Transmission electron microscopy: History and Aberration Correction

Explores the history of Transmission Electron Microscopy and the advancements in aberration correction techniques, discussing various contrasts in TEM imaging.

Magnification: The Human Eye and Microscope

Explores magnification in microscopy, including the human eye and compound microscopes.

High-Resolution TEM Imaging: Phase Contrast and Simulations

Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.

SEM Basics: Introduction to Electron Microscopy

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Optical Systems: Lenses and Eye Anatomy

Explores ray constructions through lenses, total internal reflection, dispersion, and eye anatomy.