Nanoscale MEMS or NEMS | EPFL Graph Search

Atomic Force Microscopy: Nanoscale Metrology

Explores Atomic Force Microscopy, covering principles, applications, resolution, feedback mechanisms, and imaging techniques.

Scanning Probe Microscopy: Self-Sensing Cantilevers

Explores self-sensing cantilevers in Scanning Probe Microscopy and the advantages of integrated sensor-actuator systems for high-speed data collection.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.

Nanoscale MEMS: Fabrication, Tips, and Microscopy

Covers the fabrication of nanoscale MEMS devices and the operation of the Atomic Force Microscope for measuring ultrasmall forces on particles.

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