Scanning probe microscopy: basics

This lecture covers the basics of Scanning Probe Microscopy (SPM), focusing on Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). STM provides structural and electronic analysis of conductive materials, while AFM measures forces on surfaces without the need for conductivity. The lecture explains the principles, instrumentation, imaging techniques, and spectroscopy methods of SPM, highlighting the resolution capabilities and various operating modes of AFM. It also discusses the applications of SPM in surface analysis, including spectroscopy by tunnelling effect and STM engraving. The presentation concludes with a detailed explanation of AFM imaging modes, such as contact, non-contact, and tapping modes.