Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Covers the 2x2 transfer matrix for optical systems and the characterization using height and angle parameters, along with lens systems and entrance pupils.
Introduces fundamental optics concepts, covering refraction, reflection, interference, polarization, and more, exploring the behavior of light in different media.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
