Electron Microscopy: TEM

Related lectures (32)

Page 3 of 4

Covers the principles of electron microscopy, STEM, HAADF, EDX microanalysis, and applications in materials science.

Explores the principles and applications of tomography, showcasing examples of direct tomography and advanced imaging techniques.

Explores Scanning Transmission Electron Microscopy (STEM) principles, detectors, contrast mechanisms, and applications in high-resolution imaging.

Covers the basics of transmission electron microscopy for materials science.

Covers electron microscopy principles, detectors, and contrast mechanisms.

Covers the basics of electron diffraction, explaining contrast in TEM images and its applications in material analysis.

Explores dynamical scattering in electron diffraction, discussing interdependent scattering and challenging interpretation of diffracted beams.

Explores advanced techniques in transmission electron microscopy, focusing on phase contrast imaging and camera settings.

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Explores diffraction, interference, X-ray diffraction, and light diffusion efficiency.