Scanning Electron Microscopy: Fundamentals and Applications

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Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Scanning Electron Microscopy Basics

Covers the basics of Scanning Electron Microscopy, including working principles, image generation, signal production, and challenges.

STEM and EDX

Covers STEM and EDX principles, X-ray generation, quantification methods, and analytical TEM applications.

Scanning Electron Microscopy: Basics

Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Introduction to Transmission Electron Microscopy: History and Principles

Introduces transmission electron microscopy, covering its history, principles, and various contrast mechanisms used in imaging.

Inelastic Scattering in Transmission Electron Microscopy

Introduces inelastic scattering in transmission electron microscopy, focusing on electron energy-loss spectroscopy principles and applications.

Microscopy in situ and TEM Q&A

Explores in situ electron microscopy applications, traction experiments, environmental effects, XRD, and EDS.

Transmission Electron Microscopy: basics

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Electron Microscopy: Instrumentation in Life Sciences

Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.