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Explores synchrotrons, x-ray techniques, ptychographic tomography, and laminography for high-resolution 3D reconstructions and nondestructive sample studies.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores lensless imaging and coherent X-ray diffractive imaging techniques and applications, including high-resolution 3-D imaging of nanocrystal strain.
