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Related lectures (28)

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Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Image Acquisition

Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.

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Microscopy at Nanoscale: Techniques and Applications

Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.

Radiation-Matter Interaction: Electron Microscopy Introduction

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Basic Optical Microscopy: Techniques for Polymer Morphological Characterization

Introduces basic optical microscopy for polymer characterization, covering resolution, contrast, and different observation modes.

Atomic Force Microscopy: Nanoscale Metrology

Explores Atomic Force Microscopy, covering principles, applications, resolution, feedback mechanisms, and imaging techniques.

Aberration Correction in HRTEM

Explains the principles of HRTEM, including contrast transfer, lenses, and aberration correction.

Gaussian Mixture Models: Data Classification

Explores denoising signals with Gaussian mixture models and EM algorithm, EMG signal analysis, and image segmentation using Markovian models.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.