Scanning Probe Microscopy: Techniques and Applications

Related lectures (32)

Page 3 of 4

Covers the role of donors and acceptors in semiconductor physics and the control of conductivities.

Covers the fundamentals of tunneling current and conductance quantization in nanoscale phenomena.

Explores semiconductor physics under high electric fields, discussing carrier transport, recombination processes, and the impact of injection.

Covers the history and physics of solar cells, emphasizing their efficiency metrics and operation under different conditions.

Covers the physics of p-n junctions, including properties at thermal equilibrium, space charge region formation, and optical lithography.

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Explores contact resistance modeling in semiconductor devices, focusing on gate voltage calculation and defect analysis.

Covers synchrotrons, x-ray lasers, and atomic resolution techniques like Cryo-EM and scanning tunneling microscopy.

Delves into the physics of semiconductors, exploring their properties and applications in electronics and optoelectronics.

Explores the principles and applications of Scanning Probe Microscopy techniques.