Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
