EBSD Basics: Techniques and Applications

This lecture covers the basics of Electron Backscatter Diffraction (EBSD) in the Scanning Electron Microscope (SEM), including the acquisition of EBSD patterns, diffraction of backscattered electrons, and the Hough transform for pattern analysis. It also discusses the uses of EBSD, such as orientation measurements, phase identification, and quantitative microstructural data. The influence of accelerating voltage on EBSD, spatial and angular accuracy, and applications in texture analysis are explored. The lecture delves into the indexing cycle, data analysis, and orientation representations, showcasing examples like directional solidification of alloys and phase identification in materials. Various applications of EBSD in micro-crystallography, symmetry analysis, and chemical analysis are highlighted.