EBSD Basics: Applications and Techniques

This lecture covers the basics of Electron Backscatter Diffraction (EBSD) in Scanning Electron Microscopy (SEM), including orientation measurements, phase identification, and near-surface techniques. It explains how EBSD patterns are obtained, the importance of sample preparation, and the acquisition and indexation of EBSPs. The lecture also discusses the Hough transform for band detection, the influence of accelerating voltage, and the spatial and angular accuracy of EBSD. Furthermore, it explores the applications of EBSD in micro-crystallography, phase identification, and texture analysis, showcasing examples of directional solidification and phase identification in different materials.