Frontiers in Nanoscience: Introduction and Advanced Techniques

Related lectures (32)

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Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Covers synchrotrons, x-ray lasers, and atomic resolution techniques like Cryo-EM and scanning tunneling microscopy.

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Covers the principles and techniques of electron microscopy, focusing on the interaction between radiation and matter.

Introduces the basics of electron microscopy, covering components, interactions, imaging modes, and nanofabrication techniques.

Explores High Resolution TEM principles for atomic-level crystal imaging.