Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores imaging modes in TEM, covering electron interactions, diffraction, contrast formation, and astigmatism correction.
Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Covers STEM and EDX principles, X-ray generation, quantification methods, and analytical TEM applications.
