Improving Electron Microscope Capabilities: Cold Field Emission Source

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Explores the operation and imaging techniques of Transmission Electron Microscopy (TEM), including service mode setup and digital micrograph usage.

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.