Lecture

Improving Electron Microscope Capabilities: Cold Field Emission Source

Description

This lecture explores the design of a new cold field emission electron source to enhance electron microscope capabilities. Topics include coherent TEM methods, electron holography, cold field emission principles, and the challenges and benefits of ultrafast electron sources.

Official source

https://mediaspace.epfl.ch/media/0_yxd6ui4v

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

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