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Davide Garetto

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Related publications (9)

Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.

Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis

Alexandre Schmid, Yusuf Leblebici, Davide Garetto

Complementary MOS device electrical performances are considerably affected by the degradation of the oxide lay- ers and Si/SiO2 interfaces. A general expression for electrically stressed MOS impedance has been derived and applied within the nonradiative mu ...

Institute of Electrical and Electronics Engineers2012

Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model

Alexandre Schmid, Yusuf Leblebici, Davide Garetto

A multiphonon-assisted model included in a Poisson-Schroedinger solver has been applied to the calculation of the capture/emission trapping rates of CMOS oxide interface defects. The dependencies of trap capture cross-sections with trap energy, depth, appl ...

2012

Comparing defect characterization techniques with non-radiative multiphonon charge trapping model AC analysis, trap-assisted-tunneling and charge pumping

Alexandre Schmid, Davide Garetto

The advantages and drawbacks of Capacitance vs Voltage (CV) characteristics, trap-assisted gate leakage tunneling and multi-frequency charge pumping techniques, have been brought out through an attentive investigation of oxide defects in CMOS technologies. ...

Springer Verlag2012