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Vladimir Pashchenko

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Vladimir Pashchenko

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Material Parameter Extraction for Complex AlScN Thin Film Using Dual Mode Resonators in Combination with Advanced Microstructural Analysis and Finite Element Modeling

Abnormal Grain Growth in AlScN Thin Films Induced by Complexion Formation at Crystallite Interfaces

Free standing and solidly mounted Lamb wave resonators based on Al0.85Sc0.15N thin film

Growth, Properties, and Applications of Al1-xScxN Thin Films

Determination of elastic and piezoelectric properties of Al0.84Sc0.16N thin films

Material Constants Extraction For Alscn Thin Films Using A Dual Mode Baw Resonator

Effective SAW excitation on non-piezoelectric substrate using AlScN piezoelectric thin film BAW/SAW hybrid transducer

Enhanced piezoelectric properties of c-axis textured aluminium scandium nitride thin films with high scandium content: influence of intrinsic stress and sputtering parameters

Ex-situ AlN seed layer for (0001)-textured Al0.84Sc0.16N thin films grown on SiO2 substrates

Hybrid BAW/SAW AlN and AlScN Thin Film Resonator First Experimental data