Publication

First-principles study of defects at the SiC/SiO2 interface through hybrid functionals

Related publications (40)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

First-principles study of defects at the SiC/SiO2 interface through hybrid functionals

Graph Chatbot

Chat with Graph Search

Investigation of Two-Dimensional Electron Gases with Angular Resolved Photoemission Spectroscopy

Graphene-based Field-effect Transistors

Charge transition levels of nitrogen dangling bonds at Si/SiO2 interfaces: A first-principles study

102-GHz AlInN/GaN HEMTs on Silicon With 2.5-W/mm Output Power at 10 GHz

Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations

Atomistic model of the 4H(0001)SiC-SiO2 interface: structural and electronic properties

Abrupt model interface for the 4H(1000)SiC-SiO2 interface

Electronic structure at realistic Si(100)-SiO2 interfaces

Formation and properties of nanometer-thick platinum silicide layers

Artificial Band Discontinuities at GaAs Homojunctions