We report on real-time detection of single electrons inside a n-p-n bipolar junction transistor at room temperature. Single electrons injected through the base-emitter junction trigger with a high probability the avalanche breakdown of the strongly reverse-biased collector-base junction. The breakdown, rapidly stopped by an avalanche quenching circuit, produces a voltage pulse at the collector which corresponds to the detection of a single electron. Pulse rates corresponding to currents down to the attoampere range are measured with an integration time of about 10 s. © 2008 American Institute of Physics.
Edoardo Charbon, Claudio Bruschini, Won Yong Ha, Myung Jae Lee
Elison de Nazareth Matioli, Remco Franciscus Peter van Erp, Armin Jafari, Palliyage Srilak Nirmana Perera, Georgios Kampitsis, Jessy Anthony Ançay