Publication
During the design phase of a modular multilevel converter (MMC), an accurate loss evaluation of the submodule (SM) plays an important role. In this paper, a method based on the analytical description of the MMC key waveforms that allows to directly obtain the average semiconductor and capacitor losses that each SM will experience is introduced, under different operating conditions or control schemes. To verify the proposed concept, the results are compared with the losses obtained from a switched model with closed-loop control, where the analytical MMC key waveforms are approached in steady state. The proposed method provides a great flexibility and a significant reduction of the simulation / computational time otherwise needed to evaluate SM losses under various operating conditions.
Alexandre Schmid, David Palomeque Mangut
Ignacio Alejandro Polanco Lobos
Edoardo Charbon, Andrei Ardelean, Emanuele Ripiccini, Andrada Alexandra Muntean, Esteban Venialgo Araujo