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Batch Fabrication of Multilayer Polymer Cantilevers with Integrated Hard Tips for High-Speed Atomic Force Microscopy

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Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

Single channel Josephson effect in a high transmission atomic contact

Klaus Kern, Markus Etzkorn, Jacob Senkpiel

The Josephson effect in scanning tunneling microscopy (STM) is an excellent tool to probe the properties of a superconductor on a local scale. We use atomic manipulation in a low temperature STM to create mesoscopic single channel contacts and study the Jo ...

NATURE PUBLISHING GROUP2020

A novel microfabrication platform for hybrid multilayer MEMS

Nahid Hosseini

In Atomic force microscopy (AFM), the tip-sample interaction force can be measured through two primary detection techniques: optical beam detection (OBD) and electrical (self-sensing) readout. Compared to the optical method, the convenience of the self-sen ...

EPFL2019

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...

AMER CHEMICAL SOC2019

Advances in High-Speed Atomic Force Microscopy

Adrian Pascal Nievergelt

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...

EPFL2018

Vectorial scanning force microscopy using a nanowire sensor

Anna Fontcuberta i Morral, Nicola Rossi

Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation. Furthermore, by virtue of slight asymmetries in ge ...

Nature Publishing Group2017

Harnessing the damping properties of materials for high-speed atomic force microscopy

Jürgen Brugger, Georg Fantner, Adrian Pascal Nievergelt, Blake William Erickson, Jonathan David Adams, Jonas Grossenbacher

The success of high-speed atomic force microscopy in imaging molecular motors1, enzymes2 and microbes3 in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic ...

Nature Publishing Group2016

Method and apparatus of using a scanning probe microscope

Adrian Pascal Nievergelt, Jonathan David Adams

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an inte ...

2016

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Tip-scanning high-speed atomic force microscopes (HS-AFMs) have several advantages over their sample-scanning counterparts. Firstly, they can be used on samples of almost arbitrary size since the high imaging bandwidth of the system is immune to the added ...

2016

A vibration suppression approach to high-speed atomic force microscopy

Georg Fantner

The possibility of many new applications and novel scientific observations can be provided by efficient and reliable high-speed atomic force microscopy techniques. However, the reliability of the AFM images decreases significantly as the imaging speed is i ...

2012