Deep defects in InGaN LEDs: modeling the impact on the electrical characteristics

Deep defects have a fundamental role in determining the electro-optical characteristics and in the efficiency of InGaN light-emitting diodes (LEDs). However, modeling their effect on the electrical characteristics of the LED is not straightforward. In this paper we analyze the impact of the defects on the electrical characteristics of LEDs: we analyze three single-quantum-well (SQW) InGaN/GaN LED wafers, which differ in the density of defects. Through steady-state photocapacitance (SSPC) and light-capacitance-voltage measurements, the energy levels of these deep defects and their concentrations have been estimated. By means of a simulation campaign, we show that these defects have a fundamental impact on the current voltage characteristic of LEDs, especially in the sub turn-on region. The model adopted takes into consideration trap assisted tunneling as the main mechanism responsible for current leakage in forward bias. For the first time, we use in simulations the defect parameters (concentration, energy) extracted from SSPC. In this way, we can reproduce with great accuracy the current-voltage characteristics of InGaN LEDs in a wide current range (from pA to mA). In addition, based on SSPC measurements, we demonstrate that the defect density in the active region scales with the QW thickness. This supports the hypothesis that defects are incorporated in In-containing layers, consistently with recent publications.

Polarization properties of semiconductor quantum dot and dash lasers

Philipp Ridha

Self-assembled quantum-dots (QDs) represent a distributed ensemble of zero dimensional structures, each presenting a near-singular density of states. The QD size, shape, areal density and optical properties depend on growth parameters, such as growth temperature, growth rate and amount of InAs deposed. QDs are very suitable for optoelectronic device applications as during the epitaxial QD growth the phase transition relieves the strain elastically without introducing defects. Embedded in the active medium of a semiconductor laser diode QD's unique properties lead to improved and often novel characteristics as compared to bulk or quantum-well (QW) devices. In particular In(Ga)As QD lasers on GaAs substrates are of largest interest as the spectral range of their emission wavelength reaches further into the infrared than that of QW lasers of the same material system. The emission wavelength of strained InGaAs QW lasers is limited to about 1150nm, whereas in In(Ga)As QD lasers an emission wavelength beyond 1.3µm is feasible. Such kind of QD lasers performed – as recently reported – ultralow threshold current densities combined with decreased temperature sensitivity, relatively high modulation bandwith, low chirp, which has been already predicted many years ago. Beside quantum dot's application in semiconductor lasers, it has been suggested to use QDs also for the optical active region in so-called semiconductor optical amplifier (SOA). So far, experimentally it was possible to demonstrate in QD SOAs a much faster gain recovery time due to more effective carrier re-filling from excited states than in quantum well structures. Also a smaller noise figure ratio compared to QWs was predicted in QD SOA, but has not been experimentally demonstrated yet. However, two major constraints related to the limit of the high-frequency modulation of QD lasers and the QD SOA's polarization sensitivity are required to be first resolved, before it is possible to implement both technologies replacing QW devices in optical broad telecommunications devices. The polarization properties of semiconductor quantum dot/-dash lasers and amplifiers have been addressed in this PhD thesis. Within this research work – studying systematically several quantum dot and -dash heterostructure of different material families – two major goals have been identified: (1) characterization of the optical polarization properties of quantum dot/-dash structures embedded in the active region of semiconductor optical amplifiers and (2) realization of polarization-insensitive quantum dot based SOAs. Moreover, this thesis focuses on the understanding of the underlying physics being responsible for the QD's polarization and the dependence of the optical gain on the QD's aspect ratio and compositional material contrast. In terms of the experimental work broad area laser devices have been fabricated by applying different clean room processing methods like photolithography, metal deposition, wet and plasma etching. Through a subsequent device characterization using optoelectronic measurement techniques the polarization characteristics of dots and dashes have been accessed. From broad area laser device characterization – measuring the polarization-resolved edge-emitted electroluminescence (EL) – the polarization properties of standard Stranski-Krastanov (SK), closely- and columnar stacked InAs/GaAs quantum dots as well of closely-stacked InAs/InP quantum dots and columnar-stacked InAs/InP quantum dashes – in total 32 devices – have been evaluated. The comparison of the transversal magnetic (TM) versus -electric (TE) integrated EL signal for above heterostructures provided very promising results in order to achieve polarization-independent QD SOA: Starting from standard SK QDs – emitting dominantly in TE mode – it was possible first to enhance the TM EL signal compared to TE by epitaxial shape-engineering of the dot/dash structure of the QD's aspect ratio and the compositional material contrast in columnar-stacked InAs/GaAs (InAs/InP) QDs (QDashes), and then inverting the polarization direction from dominant TE towards dominant TM. The latter polarization transition has been also confirmed by photovoltage spectroscopy (PVS), and as well from room-temperature TM-lasing demonstration – both carried out by our research partner from the Cardiff University, Wales (UK). Introducing the well-known segment contact method for gain measurements, which is based on the analysis of the amplified spontaneous emission (ASE) generated by cavities of different length, it was possible to access both the TM and TE gain of such columnar-stacked InAs/GaAs quantum dots. The work was motivated and funded by the European Union project "Zero Order Dimension based Industrial components Applied to teleCommunications" (ZODIAC) within the sixth framework program. Very fruitful collaborations in order to exchange scientific ideas/know-how and achieving joint results have been established in a pan-European and multicultural inspired environment between four industrial partners – Alcatel Thales III-V Lab (France), Bookham (GB), Innolume – GmbH (Germany), Nanoplus Nanosystems and Technologies-GmbH (Germany) – and three national research institutes – Laboratory for Photonics and Nanostructures (France), The Tyndall National Institute (Irland), Saint-Petersburg Physics and Technology Centre for Research and Education of the Russian Academy of Science (Russia) – and three Universities: École Polytechnique Fédérale de Lausanne (Switzerland), Politechnika Wroclawska (Poland), Würzburg University (Germany). Besides this European ZODIAC project it was possible to establish with the Cardiff University, Wales (UK) a very constructive collaboration.

EPFL2008

Quantum size effects in ultrathin metallic islands

I-Po Hong

This thesis reports measurements concerning quantum size effects of single crystalline metallic islands by using low-temperature scanning tunneling microscopy (STM) and spectroscopy (STS). Different sample systems are presented in the following chapters. In chapter 2, several aspects of quantum well states (QWS) of Pb ultrathin islands grown on Si(111) substrate are reported. The differential conductance spectra of QWS can be understood by discrete energy levels with linewidth broadening because of finite quasiparticle lifetime. Using low temperature scanning tunneling spectroscopy, we studied the linewidth of unoccupied quantum-well states (QWS) in Pb islands, grown on Si(111) on two different Pb/Si interfaces, of thicknesses between 7 and 22 monolayers. A quantitative analysis of the differential conductance spectra allowed us to determine the QWS lifetime broadening as a function of energy, showing agreement with 3D Fermi-liquid theory, as well as the electron-phonon (e-ph) contribution between 5 and 50 K. Layer-dependent ab initio calculations of the e-ph linewidth contributions are in excellent agreement with the data. Importantly, the sum of the calculated e-e and e-ph lifetime broadening follows the experimentally observed quadratic energy dependence. In chapter 3, studies investigating reduction of the superconducting gap of ultrathin Pb islands are presented. The energy gap Δ of superconducting Pb islands grown on Si(111) was probed in situ between 5 and 60 monolayers by low-temperature scanning tunneling spectroscopy. Δ was found to decrease from its bulk value as a function of inverse island thickness. Corresponding Tc values, estimated using bulk gap-to-Tc ratio, are in quantitative agreement with ex situ magnetic susceptibility measurements, however, in strong contrast to previous scanning probe results. Layer-dependent ab initio density functional calculations for free-standing Pb films show that the electron-phonon coupling constant, determining Tc, decreases with diminishing film thickness. In chapter 4, we present preliminary results on single electron tunneling and Coulomb blockade phenomena of metallic islands decoupled from a Ag(111) substrate by dielectric NaCl layers. Using low temperature STM/STS, the geometry of the metallic island can be determined unambiguously and the single electron tunneling properties are characterized. Using orthodox theory of single electron tunneling, the tunneling spectra can be reproduced qualitatively. Despite minor quantitative disagreement between data and simulations, the parameters of the double barrier tunneling junction, including the capacitances and the resistances of both junctions, as well as the residual charge, can be determined.

EPFL2009

Effects of 5 MeV electron irradiation on deep traps and electroluminescence from near-UV InGaN/GaN single quantum well light-emitting diodes with and without InAlN superlattice underlayer

Raphaël Butté, Jean-François Carlin, Nicolas Grandjean, Camille Haller, Mauro Mosca

The electrical properties, electroluminescence (EL) power output and deep trap spectra were studied before and after 5 MeV electron irradiation of near-UV single-quantum-well (SQW) light-emitting diodes (LED) structures differing by the presence or absence of InAlN superlattice underlayers (InAlN SL UL). The presence of the underlayer is found to remarkably increase the EL output power and the radiation tolerance of LEDs, which correlates with a much lower and more slowly changing density of deep traps in the QW region with radiation dose, and the higher lifetime of charge carriers, manifested by higher short-circuit current and open-circuit voltage in current-voltage characteristics under illumination. The observed phenomena are explained by the capture of native defects segregated at the growing surface by In atoms in the underlayer which traps them in the underlayer and prevents their penetration into the QW region.