Category of modulesIn algebra, given a ring R, the category of left modules over R is the whose are all left modules over R and whose morphisms are all module homomorphisms between left R-modules. For example, when R is the ring of integers Z, it is the same thing as the . The category of right modules is defined in a similar way. One can also define the category of bimodules over a ring R but that category is equivalent to the category of left (or right) modules over the enveloping algebra of R (or over the opposite of that).
D-moduleIn mathematics, a D-module is a module over a ring D of differential operators. The major interest of such D-modules is as an approach to the theory of linear partial differential equations. Since around 1970, D-module theory has been built up, mainly as a response to the ideas of Mikio Sato on algebraic analysis, and expanding on the work of Sato and Joseph Bernstein on the Bernstein–Sato polynomial. Early major results were the Kashiwara constructibility theorem and Kashiwara index theorem of Masaki Kashiwara.
Sheaf of modulesIn mathematics, a sheaf of O-modules or simply an O-module over a ringed space (X, O) is a sheaf F such that, for any open subset U of X, F(U) is an O(U)-module and the restriction maps F(U) → F(V) are compatible with the restriction maps O(U) → O(V): the restriction of fs is the restriction of f times that of s for any f in O(U) and s in F(U). The standard case is when X is a scheme and O its structure sheaf. If O is the constant sheaf , then a sheaf of O-modules is the same as a sheaf of abelian groups (i.
Multi-agent systemA multi-agent system (MAS or "self-organized system") is a computerized system composed of multiple interacting intelligent agents. Multi-agent systems can solve problems that are difficult or impossible for an individual agent or a monolithic system to solve. Intelligence may include methodic, functional, procedural approaches, algorithmic search or reinforcement learning. Despite considerable overlap, a multi-agent system is not always the same as an agent-based model (ABM).
Scanning probe lithographyScanning probe lithography (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write, mask-less approach which bypasses the diffraction limit and can reach resolutions below 10 nm. It is considered an alternative lithographic technology often used in academic and research environments. The term scanning probe lithography was coined after the first patterning experiments with scanning probe microscopes (SPM) in the late 1980s.
Scanning tunneling microscopeA scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Kelvin probe force microscopeKelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales.
Intelligent agentIn artificial intelligence, an intelligent agent (IA) is an agent acting in an intelligent manner; It perceives its environment, takes actions autonomously in order to achieve goals, and may improve its performance with learning or acquiring knowledge. An intelligent agent may be simple or complex: A thermostat or other control system is considered an example of an intelligent agent, as is a human being, as is any system that meets the definition, such as a firm, a state, or a biome.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
