In this work, we aim to understand the firing behaviour of three representative thick-film resistor compositions used in force and pressure sensors. The dependence of the materials' microstructure and properties (sheet resistance and its temperature coefficient, gauge factor) is studied as a function of firing temperature and time, and cooling rate (furnace or quench). The stability of the properties is assessed by annealing at intermediate temperatures (100 and 250 °C). Microscopic and structural analysis is also carried out. The results are discussed in the light of the possible evolution mechanisms of the resistor materials: diffusion, dissolution, precipitation and stress relaxation.
Eugen Brühwiler, Numa Joy Bertola, Philippe Schiltz
Timothy Goodman, René Chavan, Anastasia Xydou, Matteo Vagnoni, Humberto Torreblanca Quiroz
David Andrew Barry, Ulrich Lemmin, François Mettra, Rafael Sebastian Reiss