MSE-675: Introduction to SEM and FIB microanalysisModern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists
MSE-627: X-Ray Analysis for thin filmsIntro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques;
Structural prope
MSE-450: Electron microscopy: advanced methodsWith this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.