Cours

MSE-636(a): Scanning electron microscopy techniques (a)

Cours associés (25)

MSE-636(b): Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical re

PHYS-405: Experimental methods in physics

The course's objectivs are: Learning several advenced methods in experimental physics, and critical reading of experimental papers.

MSE-352: Introduction to microscopy + Laboratory work

Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux m

MSE-637(b): Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics

CH-633: Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical

CH-410: Physical and chemical analyses of materials

The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials.

MICRO-561: Biomicroscopy I

Introduction to geometrical and wave optics for understanding the principles of optical microscopes, their advantages and limitations. Describing the basic microscopy components and the commonly used

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.

MICRO-530: Nanotechnology

This course gives the basics for understanding nanotechnology from an engineer's perspective: physical background, materials aspects and scaling laws, fabrication and imaging of nanoscale devices.

MSE-704: 3D Electron Microscopy and FIB-Nanotomography

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and