ELASTIC MISFIT STRESS-RELAXATION IN HIGHLY STRAINED INGAAS/GAAS STRUCTURES
Graph Chatbot
Chattez avec Graph Search
Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.
AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.
Transmission electron microscopy (TEM) is revisited in order to define methods for the identification of nanometric defects. Nanometric crystal defects play an important role as they influence, generally in a detrimental way, physical properties. For insta ...
GaN films epitaxially-grown on M-sapphire may have different orientations, either nonpolar and semipolar. In this paper, the different epitaxial relationships are investigated in details thanks to transmission electron microscopy. It is shown that these re ...
Oxide dispersion strengthened steels based on the ferritic/martensitic steel EUROFER97 are developed. The reinforcing particles dispersed in the matrix of EUROFER97 are made of yttria and yttrium titanium oxides. Microstructure is investigated by transmiss ...
The core–shell structure of a range of acrylic–acrylic latexes has been investigated by combining different specimen preparation methods with transmission electron microscopy (TEM), dark-field scanning transmission electron microscopy (DSTEM) and low-volta ...
By means of transmission electron microscopy (TEM) the structure of chemically ordered regions in Zr-doped Pb(Mg1/3Ta2/3)O-3 has been studied. Large coherent ordered domains were obtained by the addition of 5 mol% PbZrO3. The results obtained by convention ...
GaN/AlN quantum-dot superlattices grown by molecular-beam epitaxy on silicon (111) or sapphire (0001) substrate have been investigated using high-resolution transmission electron microscopy, photoluminescence, and photo-induced absorption spectroscopy. Und ...
Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) coupled to molecular dynamics (MD) calculations. The displacement cascades are simulated for energies ranging from 10 to 50 keV in Al, Ni and Cu and for time ...
Surface processing of a Ti–6Al–4V alloy led to a complex multilayered microstructure containing several phases of the Ni–Ti–P–Al–O system, which improves the mechanical and tribological surface properties. The microstructure, chemical and phase composition ...
Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grown via the vapour-liquid-solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have bee ...