Publication
Using the Y-function method, this paper experimentally investigates the effects of total ionizing dose up to 1 Grad on the channel mobility of a commercial 28-nm bulk CMOS process.
Sylvain Dunand, Nicolas Würsch, Luca Massimiliano Antognini, Jonathan Emanuel Thomet, Matthew James Large
Sylvain Dunand, Nicolas Würsch, Matthew James Large, Giulia Rossi
Edoardo Charbon, Francesco Piro, Ashish Sharma