Microscopy in situ and TEM Q&A

In course

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Description

This lecture covers in situ electron microscopy applications, including traction in SEM, environmental TEM, and post-heating TEM analysis. Topics include observing samples in real-time, traction experiments, and environmental effects on materials. Techniques such as XRD and EDS are also discussed.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_9vza0r8a

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Chemistry

Physical chemistry: Spectroscopy

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