Lecture

Transmission Electron Microscopy: basics

In course

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Description

This lecture introduces the basics of Transmission Electron Microscopy (TEM), focusing on the principles, applications, and components of TEM instruments. It covers topics such as electron beam energy, sample preparation, imaging modes, and interactions between electrons and samples. The lecture also discusses the importance of lens aberration corrections, resolution, magnification, and depth of field in TEM imaging. Additionally, it explores advanced techniques like High Tension TEM (HT-TEM) and Scanning TEM (STEM) for surface analysis. Overall, the lecture provides a comprehensive overview of TEM, its capabilities, and its significance in various scientific fields.

Instructor

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Official source

https://mediaspace.epfl.ch/media/0_b05eawao

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Ontological neighbourhood

Physics

Optics: Geometrical optics

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Chemical engineering

Nanotechnology: Topics in nanotechnology

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