Semiconductor Devices II: CV Modelling

In course

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Description

This lecture covers the analysis of defect probing through CV measurements, defects in 2D materials, CV measurements on 2D materials, modelling of defects, experimental data, and the procedure to follow. It also includes the calculation of charge density, channel voltage, and the plot of real and ideal MoS2 DOS.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_sw5ta52i

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