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Concept
Electron microscope
Summary
An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. Electron microscope may refer to:
Transmission electron microscopy (TEM) where swift electrons go through a thin sample
Scanning transmission electron microscopy (STEM) is similar to TEM with a scanned electron probe
Scanning electron microscope (SEM) is similar the STEM, but with thick samples
Electron microprobe similar to a SEM, but more for chemical analysis
Ultrafast scanning electron microscopy, version of SEM that can operate very fast
Low-energy electron microscopy (LEEM), used to image surfaces
Photoemission electron microscopy (PEEM) is similar to LEEM using electrons produced at surfaces by photons
Additional details can be found in the above. This articles contains some general information mainly about transmission electron microscopes.
Transmission electron microscopy#History
Many developments laid the groundwork of the electron optics used in microscopes. One significant step was the work of Hertz in 1883 who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam. Others were focusing of the electrons by an axial magnetic field by Emil Wiechert in 1899, improved oxide-coated cathodes which produced more electrons by Arthur Wehnelt in 1905 and the development of the electromagnetic lens in 1926 by Hans Busch. According to Dennis Gabor, the physicist Leó Szilárd tried in 1928 to convince him to build an electron microscope, for which Szilárd had filed a patent.
To this day the issue of who invented the transmission electron microscope is controversial.
Official source
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