Concept
X-ray spectroscopy
Related lectures (109)
Electron Microscopy: EDS
Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
X-ray Diffraction in Crystals
Covers X-ray diffraction in crystals, focusing on diffraction principles and constructive interference.
Powder Characterisation: Physical, Chemical, Morphology
Explores the physical, chemical, and morphological analysis of powders, emphasizing sampling accuracy and quality control.
Diffraction: Basics
Covers the basics of diffraction phenomena, diffraction patterns, gratings, the diffraction limit, and X-ray techniques.
Characterization Approaches for Solid Materials
Covers fundamental characterization approaches for solid materials, focusing on elemental analysis, thermal analysis, microscopy, and neutron-based spectroscopies.
X-Ray Fluorescence Spectrometry XRFS
Covers X-Ray Fluorescence Spectrometry (XRFS), a chemical analysis technique using emitted X-rays when excited by an X-ray primary beam.
Intermediate Electron Microscopy Test: Detectors and Probes
Discusses detectors in electron microscopy and probe size control.
Electron Microscopy: EDS and ESEM
Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.
Inelastic Scattering in Transmission Electron Microscopy
Introduces inelastic scattering in transmission electron microscopy, focusing on electron energy-loss spectroscopy principles and applications.
X-ray Tomography: Principles and Applications
Explores x-ray tomography principles, including generation, interaction with matter, detection methods, and practical examples.