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Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Introduces fundamental optics concepts, covering refraction, reflection, interference, polarization, and more, exploring the behavior of light in different media.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
