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Explores the operation and analysis of a scanning electron microscope, covering SEM controls, detectors, image acquisition, spectra analysis, and software usage.
Explains Bragg's law in Transmission Electron Microscopy, focusing on the relationship between wavelength, crystal lattice spacing, and diffraction angle.
Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
